Products

Pour/Cloud Point Testers

MPC-602

MPC-602 Pour/Cloud Point Testers

TANAKA's MPC series has been designed for automatic determination of POUR POINT (PP) and CLOUD POINT (CP) with small specimen size and shorter test cycle time while securing better test precision than the conventional manual methods.

PP measurement is by "AIR PRESSURE METHOD" (ASTM D6749), and CP measurement is by "SMALL TEST JAR METHOD" (ASTM D7683).

The epoch-making automatic PP test method yields 1°C test resolution, while the new CP method yields 0.1°C resolution.

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Specifications

Test Methods PP: ASTM D6749, ASTM D97, ISO 3016
CP: ASTM D7683, ASTM D2500, ISO 3015
Type Bench top, 6 positions, with liquid cooled Peltier cooler
Measuring range +51 to -65°C when used with 3 sets of TCU-40B chiller (opt)
Display VFD modules (×6)
Ext. port RS-232C
Size 800(W) × 550(D) × 850(H) mm
Weight 100kg
Power cons. 1.5kW

*Note: Inquire derivery time.

Principle of Pour Point Detection

Principle of Pour Point Detection